Benning ST 755+. Device tester for testing electrical devices/work equipment in accordance with DIN EN 50678 (VDE 0701), DIN EN 50699 (VDE 0702), DGUV Regulation 3 and medical-electrical devices in accordance with DIN0751-1, DIN EN 62353, such as hospital/care beds. Graphic display. Limit value display yes. Measurements: Insulation resistance measuring range 0.1 MOhm - 100 MOhm. Nominal test voltage 100 V. Nominal test voltage 250 V. Nominal test voltage 500 V. Nominal voltage 1000 V. Adjustable. Protective conductor resistance measuring range 0.05 Ohm - 10 Ohm. Test current 600 mA/10A. Equivalent leakage current yes. Differential current yes. Direct measurement yes. Protective conductor current yes. Touch current yes. Protective conductor/touch current 0.03 mA - 25 mA. Consumer current measurement yes. Power measurement yes. Function test V/A/W using the True RMS true effective value measurement method. Testing of mobile PRCDs and types AC/A/F/B/B+. Connection for external measuring adapter yes. Testing of 3-phase consumers using optional measuring adapters. Additional measuring adapters optionally available. Testing of extension cables yes. Device leakage current, leakage current from the application part types B, BF and CF. Special features: Brilliant 7 inch color touch display (35% larger user interface) with innovative menu functions for simple and efficient initial testing/installation of new test items. Smart menu functions: Individually customizable device templates (24 templates per test standard) for quick test item creation with a single keystroke, Auto-ID function for automatic increment of the identification number (ID) when creating new test items, device data that can be individually displayed using the ON/OFF slider for optimized handling and use by EUPs. Favorites menu for direct jumps to frequently used submenus. Softkey keyboard (QWERTZ), graphic fields describe the predefined functions. Automatic test sequence yes. Automatic and manual test sequence with good/bad display. Measured value storage yes. Complete test item database including test history can be saved on SD card/USB stick
